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New Module Delivers Optimized Performance for High-Bandwidth Measurements in Automated Test Applications
NEWS RELEASE – July 28, 2008 – National Instruments today announced a significant bandwidth increase in its digitizer offering with the introduction of the NI PXI-5154 digitizer/PC-based oscilloscope, expanding the family of more than 20 high-speed, high-resolution and high-channel-count products. The dual-channel, 1 GHz PXI-5154 digitizer offers up to a 2 GS/s real-time sample rate （20 GS/s equivalent-time sample rate for repetitive signals）, making it ideal for acquisition and characterization of fast, nanosecond-edge speeds. Equipped with the deepest onboard memory in its class of up to 256 MB per channel, the digitizer also provides high sustained sample rates over extended data capture windows. The device is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense and life sciences industries.
Using National Instruments patented T-Clock technology, engineers can integrate PXI digitizers with a variety of NI hardware – including arbitrary waveform generators and digital waveform generators/analyzers – to customize and build a complete, automated mixed-signal test system. Using T-Clock technology, engineers also can synchronize multiple PXI-5154 digitizers to build systems with up to 34 channels in a single PXI chassis, all simultaneously sampling at 1GS/s and synchronized to picosecond-level accuracy between modules. The digitizer’s high bandwidth and tight multi-module synchronization are particularly beneficial for applications including mass spectrometry, radar, signal intelligence, non-destructive test and high-channel count physics experimentation.